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DFT Compiler SoCBIST
As technology feature sizes shrink and design complexity
grows, the quantity of test needed to maintain the semiconductor
devices quality is exploding. DFT Compiler™ SoCBIST
is an add-on to Synopsys’ DFT Compiler that reduces both
test data volume and test time significantly–compared to
highly compacted scan patterns–while obtaining the same
high-fault coverage as full-scan design. Thanks to the integration
in the Galaxy™ Design Platform, designers can implement
the SoCBIST scan compression logic transparently in their
designs, without impacting the functional, timing, or power
requirements of the design. DFT Compiler SoCBIST provides
a complete range of powerful BIST design rule checking
(DRC), synthesis, integration, verification, and diagnostic
capabilities. SoCBIST is built on the industry’s leading test
platforms, DFT Compiler and TetraMAX® ATPG, to ensure a
dependable and easy extension of your current scan flow.
Key benefits:
- Predictable, very high fault coverage
- Dramatically reduces manufacturing test cost
- Predictable, very high fault coverage
- Supports all TetraMAX fault models
- Easy to use
- Supports all design styles
- Supports hierarchical design flows
- Excellent diagnostic
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